研究成果 | Ø Wen S. T., Tan Y., Shi S., et al. Thermal contact resistance between the surfaces of silicon and copper crucible during electron beam melting. International Journal of Thermal Science, 2013, 74, 37-43. Ø Wen S. T., Jiang D. C., Li P. T., et al. Back diffusion of iron impurity during silicon purification by vacuum directional solidification. Vacuum, 2015, 119, 270-275. Ø Wen S. T., Jiang D. C., Shi S., et al. Determination and Controlling of Crystal Growth Rate during Silicon Purification by Directional Solidification. Vacuum, 2016, 125, 75-80. Ø Wen S. T., Tan Y., Yuan T., et al. A model for distribution of iron impurity during silicon purification by directional solidification. Vacuum, 2017, 145, 251-257. Ø Gan C.H.#, Wen S.T. #, Liu Y.K., et al. Preparation of Si-SiOx nanoparticles from volatile residue produced by refining of silicon. Waste Management, 2019, 84, 373-382. |